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Generalized confidence intervals for process capability indices in the one-way random model
Kurian, K.; Mathew, Thomas; Sebastian, G. - In: Metrika 67 (2008) 1, pp. 83-92
Persistent link: https://www.econbiz.de/10005602837
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Generalized confidence intervals for the process capability index C <Subscript>pm</Subscript>
Hsu, Bi-Min; Wu, Chien-Wei; Shu, Ming-Hung - In: Metrika 68 (2008) 1, pp. 65-82
Persistent link: https://www.econbiz.de/10005375757
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Two new models for survey sampling with sensitive characteristic: design and analysis
Yu, Jun-Wu; Tian, Guo-Liang; Tang, Man-Lai - In: Metrika 67 (2008) 3, pp. 251-263
Persistent link: https://www.econbiz.de/10005178918