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~isPartOf:"NBER macroeconomics annual"
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Technology shocks and aggregate fluctuations : how well does the real business cycle model fit postwar US data?
Galí, Jordi
;
Rabanal, Pau
- In:
NBER macroeconomics annual
19
(
2004
),
pp. 225-288
Persistent link: https://www.econbiz.de/10002768895
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