In recent years, the exponential-weighted-moving-average (EWMA) statistic based controllers are popular in semiconductor manufacturing. However, the single EWMA controller is not sufficient for compensating for the wear-out process. Thus, a double EWMA controller was proposed to enhance the...

Despite their diverse applications in many domains, the variable precision rough sets (VPRS) model lacks a feasible method to determine a precision parameter ([beta]) value to control the choice of [beta]-reducts. In this study we propose an effective method to find the [beta]-reducts. First, we...