da Silva, Roberto; Wirth, Gilson I.; Brederlow, Ralf - In: Physica A: Statistical Mechanics and its Applications 362 (2006) 2, pp. 277-288
In this work, based on robust experimental results, we derive a novel theoretical probabilistic approach to model the low-frequency noise power S(f) in semiconductor devices. Using the proposed approach we obtained, analytically, the average of the integrated noise power Wp=∫fLfHS(f)df as a...