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Behaviour of Lasing Wavelength Change During Degradation in Buried-Heterostructure (BH)-Type DFB Laser
Fukuda, M.; Kano, F.; Kurosaki, T.; Yoshida, J. - In: Quality and reliability engineering international 11 (1995) 4, pp. 295-298
Persistent link: https://www.econbiz.de/10006404876
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Correlation between 1-f Noise and Semiconductor Laser Degradation
Fukuda, M.; Hirono, T.; Kurosaki, T.; Kano, F. - In: Quality and reliability engineering international 10 (1994) 4, pp. 351-354
Persistent link: https://www.econbiz.de/10006408716
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Degradation Behaviour of Highly Coherent 1-55 mm Long-cavity Multiple Quantum Well DFB Lasers
Fukuda, M.; Kano, F.; Kurosaki, T.; Yoshida, J.-I. - In: Quality and reliability engineering international 9 (1993) 4, pp. 363-366
Persistent link: https://www.econbiz.de/10006413416