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In this paper, we fabricated Pt/TiOx/ZnO/n+-Si structures by inserting TiOx interlayer between Pt top electrode (TE) and ZnO thin film for non-volatile resistive random access memory (ReRAM) applications. Effects of TiOx interlayer with different thickness on the resistance switching of...
Persistent link: https://www.econbiz.de/10010933051
High-quality Nd:LuVO4 thin films have been grown on silica glass substrates by using a pulsed laser deposition technique. X-ray diffraction results show that the as-deposited Nd:LuVO4 film is basically oriented polycrystalline, and strong (200) peak was revealed. The waveguide property was...
Persistent link: https://www.econbiz.de/10005080578