Effects of thermal expansion coefficient (CTE) mismatch on structure and electrical properties of TiO2 film deposited on Si substrate by ion beam assistant electron beam evaporation have been investigated. Because of a high CTE mismatch between TiO2 film and Si substrate, microcracks appeared in...

La2O3 films were deposited on Si(100) substrates by ion beam assistant electron beam evaporation and were annealed at 450–900°C. Crystalline structure was found to change from amorphous structure to cubic and hexagonal structure with the rise in annealing temperature. The near infrared...

The Poly(vinylidene) fluoride (PVDF) thin films with a high content of β-phase were prepared by controlling heat-treatment temperature using casting from the poled solvents. The crystallite microstructure of thin films was depicted by the techniques of X-ray diffraction and FTIR. The results...