Chérif, S. M.; Roussigné, Y.; Kharmouche, A.; Chauveau, T. - In: The European Physical Journal B - Condensed Matter and … 45 (2005) 3, pp. 305-309
X-ray diffraction and magnetic force microscopy techniques were used to investigate the structural and the static magnetic properties of vapor-deposited cobalt films with various thicknesses t ranging from 50 to 195 nm. Texture measurements revealed that as the thickness increases, the films...