Narrow search
Showing 1 - 8 of 8
Cover Image
Standardized LM tests for spatial error dependence in linear or panel regression
Baltagi, Badi H.; Yang, Zhenlin - In: The econometrics journal 16 (2013) 1, pp. 103-134
Persistent link: https://www.econbiz.de/10009722509
Cover Image
Generalized LM tests for functional form and heteroscedasticity
Yang, Zhenlin; Tse, Yiu Kuen - In: The econometrics journal 11 (2008) 2, pp. 349-376
Persistent link: https://www.econbiz.de/10003750838
Cover Image
Standardized LM tests for spatial error dependence in linear or panel regressions
Baltagi, Badi H.; Yang, Zhenlin - In: The econometrics journal 16 (2013) 1, pp. 103-134
Persistent link: https://www.econbiz.de/10010075498
Cover Image
Generalized LM tests for functional form and heteroscedasticity
Yang, Zhenlin; Tse, Yiu-Kuen - In: The econometrics journal 11 (2008) 2, pp. 349-376
Persistent link: https://www.econbiz.de/10008077658
Cover Image
Non-parametric regression under location shifts
Phillips, Peter C. B.; Su, Liangjun - In: The econometrics journal 14 (2011) 3, pp. 457-486
Persistent link: https://www.econbiz.de/10009382495
Cover Image
Testing for common trends in semi‐parametric panel data models with fixed effects
Zhang, Yonghui; Su, Liangjun; Phillips, Peter C. B. - In: The econometrics journal 15 (2012) 1, pp. 56-100
Persistent link: https://www.econbiz.de/10009520548
Cover Image
Testing for common trends in semi‐parametric panel data models with fixed effects
Zhang, Yonghui; Su, Liangjun; Phillips, Peter C. B. - In: The econometrics journal 15 (2012) 1, pp. 56-101
Persistent link: https://www.econbiz.de/10009833425
Cover Image
Non‐parametric regression under location shifts
Phillips, Peter C. B.; Su, Liangjun - In: The econometrics journal 14 (2011) 3, pp. 457-487
Persistent link: https://www.econbiz.de/10009343977