Multivariate normal, due to its well-established theories, is commonly utilized to analyze correlated data of various types. However, the validity of the resultant inference is, more often than not, erroneous if the model assumption fails. We present a modification for making the multivariate...

This paper presents a brief overview of semiconductor manufacturing followed by the results of a panel session held at the Fourth International Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM) in Miami, December 10, 2008 on the role of modelling and analysis in...