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Measuring efficiency of total productive maintenance (TPM): a three-stage data envelopment analysis (DEA) approach
Jeon, Jeonghwan; Kim, Chulhyun; Lee, Hakyeon - In: Total quality management & business excellence : an … 22 (2011) 8, pp. 911-925
Persistent link: https://www.econbiz.de/10009988227
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Identifying technological opportunities using the novelty detection technique: a case of laser technology in semiconductor manufacturing
Geum, Youngjung; Jeon, Jeonghwan; Seol, Hyeonju - In: Technology analysis & strategic management 25 (2013) 1, pp. 1-22
Persistent link: https://www.econbiz.de/10010062913
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Implementing technology roadmapping with supplier selection for semiconductor manufacturing companies
Jeon, Jeonghwan; Lee, Hakyeon; Park, Yongtae - In: Technology analysis & strategic management 23 (2011) 8, pp. 899-919
Persistent link: https://www.econbiz.de/10009264845
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Monitoring trends of technological changes based on the dynamic patent lattice: A modified formal concept analysis approach
Lee, Changyong; Jeon, Jeonghwan; Park, Yongtae - In: Technological forecasting & social change : an … 78 (2011) 4, pp. 690-703
Persistent link: https://www.econbiz.de/10008889025