Shim, Jooyong; Kim, Yongtae; Lee, Jangtaek; Hwang, Changha - In: Computational Statistics 27 (2012) 4, pp. 685-700
Value at Risk (VaR) has been used as an important tool to measure the market risk under normal market. Usually the VaR of log returns is calculated by assuming a normal distribution. However, log returns are frequently found not normally distributed. This paper proposes the estimation approach...