Vedururu, Sai Sarada; Subbarayudu, M.; Sarma, K. V. S. - In: Stochastics and Quality Control 34 (2019) 2, pp. 95-102
Abstract This paper deals with a new method of deriving the Process Capability Index (PCI) when the quality characteristic X follows a positively skewed distribution. The focus of the paper is to derive a new estimate of PCI by taking into account the {100(1-{\alpha})} Confidence Intervals...