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The effect induced by the presence of a polaron related relaxation process on the dielectric properties of a ferroelectric KTa<Subscript>1−x </Subscript>Nb<Subscript> x </Subscript>O<Subscript>3</Subscript> (KTN) crystal was investigated (10<Superscript>-2</Superscript>−10<Superscript>6</Superscript> Hz, at 300−375 K) using broadband dielectric spectroscopy. Characterization of the process using just the...</superscript></superscript></subscript></subscript></subscript>
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