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Balakrishnan, N.
Lin, Chien-ting
46
Lin, Chien-Ting
33
Lee, Shih-Cheng
13
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12
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9
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IEEE transactions on reliability : R ; IEEE T R
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COMMENTS AND CORRECTIONS - Correction to "A Comparison of Two Simple Prediction Intervals for Exponentail Distribution"
Balakrishnan, N.
;
Lin, C.-T.
;
Chan, P.-S.
- In:
IEEE transactions on reliability : R ; IEEE T R
54
(
2005
)
2
,
pp. 366
Persistent link: https://www.econbiz.de/10006606820
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2
Lifetime Data Analysis - A Comparison of Two Simple Prediction Intervals for Exponential Distribution
Balakrishnan, N.
;
Lin, C.-T.
;
Chan, P.-S.
- In:
IEEE transactions on reliability : R ; IEEE T R
54
(
2005
)
1
,
pp. 27-33
Persistent link: https://www.econbiz.de/10006607719
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3
Sampling - A New Method for Goodness-of-Fit Testing Based on Type-II Right Censored Samples
Lin, C.-T.
;
Huang, Y.-L.
;
Balakrishnan, N.
- In:
IEEE transactions on reliability : R ; IEEE T R
57
(
2008
)
4
,
pp. 633-642
Persistent link: https://www.econbiz.de/10008154768
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