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COMMENTS AND CORRECTIONS - Correction to "A Comparison of Two Simple Prediction Intervals for Exponentail Distribution"
Balakrishnan, N.; Lin, C.-T.; Chan, P.-S. - In: IEEE transactions on reliability : R ; IEEE T R 54 (2005) 2, pp. 366
Persistent link: https://www.econbiz.de/10006606820
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Lifetime Data Analysis - A Comparison of Two Simple Prediction Intervals for Exponential Distribution
Balakrishnan, N.; Lin, C.-T.; Chan, P.-S. - In: IEEE transactions on reliability : R ; IEEE T R 54 (2005) 1, pp. 27-33
Persistent link: https://www.econbiz.de/10006607719
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Sampling - A New Method for Goodness-of-Fit Testing Based on Type-II Right Censored Samples
Lin, C.-T.; Huang, Y.-L.; Balakrishnan, N. - In: IEEE transactions on reliability : R ; IEEE T R 57 (2008) 4, pp. 633-642
Persistent link: https://www.econbiz.de/10008154768