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Detection of machine failure: Hidden Markov Model approach
Tai, Allen H.; Ching, Wai-Ki; Chan, L.Y. - In: Computers & industrial engineering : CAIE ; an … 57 (2009) 2, pp. 608-620
Persistent link: https://www.econbiz.de/10008889728
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Detection of machine failure: Hidden Markov Model approach
Tai, Allen H.; Ching, Wai-Ki; Chan, L.Y. - In: Computers & industrial engineering : CAIE ; an … 57 (2009) 2, pp. 608-619
Persistent link: https://www.econbiz.de/10008300935