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Curnow, Ray
Clark, John
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A Wiley-Interscience publication
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Auf Gedeih und Verderb : Mikroelektronik und Gesellschaft ; Bericht an den Club of Rome
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Global simulation models : a comparative study
Clark, John
;
Cole, Sam
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1975
Persistent link: https://www.econbiz.de/10000037377
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The future with microelectronics : forecasting the effects of information technology
Barron, Iann
;
Curnow, Ray
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1979
Persistent link: https://www.econbiz.de/10000013660
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Anwendung der Technologie
Curnow, Ray
;
Curran, Susan
- In:
Auf Gedeih und Verderb : Mikroelektronik und …
,
(pp. 101-129)
.
1982
Persistent link: https://www.econbiz.de/10002040252
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The future with microelectronics : forecasting the effects of information technology
Barron, Iann
;
Curnow, Ray
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1979
Persistent link: https://www.econbiz.de/10003998830
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