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Hayes, J.
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IEEE transactions on reliability : R ; IEEE T R
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SYSTEM RELIABILITY -- MEASURES, PREDICTION, OPTIMIZATION, ESTIMATION - Investigation of the Occurrence of: No-Faults-Found in Electronic Equipment
Jones, J.
;
Hayes, J.
- In:
IEEE transactions on reliability : R ; IEEE T R
50
(
2001
)
3
,
pp. 289-292
Persistent link: https://www.econbiz.de/10006618430
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SYSTEM RELIABILITY -- MEASURES, PREDICTION, OPTIMIZATION, ESTIMATION - Estimation of System Reliability Using a 'Non-Constant Failure-Rate' Model
Jones, J.
;
Hayes, J.
- In:
IEEE transactions on reliability : R ; IEEE T R
50
(
2001
)
3
,
pp. 286-288
Persistent link: https://www.econbiz.de/10006618431
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SYSTEM RELIABILITY -- MEASURES, PREDICTION, OPTIMIZATION, ESTIMATION - A comparison of electronic-reliability prediction models
Jones, J.
;
Hayes, J.
- In:
IEEE transactions on reliability : R ; IEEE T R
48
(
1999
)
2
,
pp. 127-134
Persistent link: https://www.econbiz.de/10006626792
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