HAN, S. M.; KIM, S. Y.; CHOO, D. C.; JUNG, J. I.; KIM, T. W. - In: Surface Review and Letters (SRL) 14 (2007) 04, pp. 807-811
Carrier density of a two-dimensional electron gas (2DEG) in Al0.3Ga0.7N/GaN and Al0.3Ga0.7N/AlN/GaN heterostructures was investigated by performing Shubnikov-de Haas (SdH) measurements. The angular-dependent SdH measurements and the fast Fourier transformation results for the SdH data indicated...
