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Karcich, R.
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IEEE transactions on reliability : R ; IEEE T R
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Software Reliability Growth with Test Coverage
Malaiya, Y.K.
;
Li, N.
;
Bieman, J.M.
;
Karcich, R.
- In:
IEEE transactions on reliability : R ; IEEE T R
51
(
2002
)
4
,
pp. 420-426
Persistent link: https://www.econbiz.de/10006615344
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