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~person:"Kueng, T.L."
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Kueng, T.L.
Pearn, W.L.
68
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Quality and reliability engineering international
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On the distribution of the estimated process yield index Spk
Lee, J.C.
;
Hung, H.N.
;
Pearn, W.L.
;
Kueng, T.L.
- In:
Quality and reliability engineering international
18
(
2002
)
2
,
pp. 111-116
Persistent link: https://www.econbiz.de/10006375174
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