Porous silicon (PS) layers have been prepared from n-type silicon wafers of (100) orientation. SEM, FTIR, and PL have been used to characterize the morphological and optical properties of PS. The influence of varying light illumination in the anodizing solution, on structural and optical...

Porous silicon layers have been prepared from n-type silicon wafers of (100) orientation. SEM, XRD, FTIR, and PL have been used to characterize the morphological and optical properties of porous silicon. The influence of varying HF concentration in the anodizing solution, on structural and...