Sinha, Debajyoti; Patra, Kauhsik; Dey, Dipak K. - In: Journal of the Royal Statistical Society Series C 52 (2003) 2, pp. 249-259
Because of the high reliability of many modern products, accelerated life tests are becoming widely used to obtain timely information about their time-to-failure distributions. We propose a general class of accelerated life testing models which are motivated by the actual failure process of...