Standard Shewhart control charts are often based on the assumption that the observations follow a specific parametric distribution, such as the normal, and outlier-free samples are initially selected to construct control limits for future monitoring of process parameters, e.g., location,...

The presence of variation in all manufacturing and measurement processes is a natural phenomenon and is the key factor which affects the performance of all types of processes. A better understanding of the causes of variability in any processes is necessary to improve the process. For an...