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Saxena, N.R.
Mitra, S.
33
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IEEE transactions on reliability : R ; IEEE T R
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SPECIAL SECTION -- FAULT-TOLERANT VLSI SYSTEMS - PAPERS - Fault-Tolerant VLSI Systems - Common-Mode Failures in Redundant VLSI Systems: A Survey
Mitra, S.
;
Saxena, N.R.
;
McCluskey, E.J.
- In:
IEEE transactions on reliability : R ; IEEE T R
49
(
2000
)
3
,
pp. 285-295
Persistent link: https://www.econbiz.de/10006621848
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