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~person:"Wu, Hsueh-Chang"
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Wu, Hsueh-Chang
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Total quality management & business excellence : an official journal of the European Society for Organisational Excellence
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ECONIS (ZBW)
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Increasing detectability in semiconductor foundry by multivariate statistical process control
Yang, Chyan
;
Chang, Chao-Jung
;
Niu, Han-Jen
;
Wu, Hsueh-Chang
- In:
Total quality management & business excellence : an …
19
(
2008
)
5/6
,
pp. 429-440
Persistent link: https://www.econbiz.de/10003740713
Saved in:
2
Increasing detectability in semiconductor foundry by multivariate statistical process control
Yang, Chyan
;
Chang, Chao-Jung
;
Niu, Han-Jen
;
Wu, Hsueh-Chang
- In:
Total quality management & business excellence : an …
19
(
2008
)
5-6
,
pp. 429-440
Persistent link: https://www.econbiz.de/10008073418
Saved in:
3
Increasing detectability in semiconductor foundry by multivariate statistical process control
Yang, Chyan
;
Chang, Chao-Jung
;
Niu, Han-Jen
;
Wu, Hsueh-Chang
- In:
Total quality management & business excellence : an …
19
(
2008
)
5
,
pp. 429-440
Persistent link: https://www.econbiz.de/10008044718
Saved in:
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