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~person:"Zhou, D-H"
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Zhou, D-H
Wang, W
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IEEE transactions on reliability : R ; IEEE T R
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Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process
Si, X-S
;
Wang, W
;
Hu, C-H
;
Zhou, D-H
;
Pecht, M G
- In:
IEEE transactions on reliability : R ; IEEE T R
61
(
2012
)
1
,
pp. 50-68
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