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Estimating and incorporating the effects of a future QE project into a semiconductor yield learning model with a fuzzy set approach
Chen, Toly - In: European journal of industrial engineering : EJIE 3 (2009) 2, pp. 207-226
Persistent link: https://www.econbiz.de/10003838369
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A diversified AHP-tree approach for multiple-criteria supplier selection
Chen, Toly - In: Computational management science 18 (2021) 4, pp. 431-453
Persistent link: https://www.econbiz.de/10012651311
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Enhancing the efficiency and accuracy of existing FAHP decision-making methods
Chen, Toly - In: EURO Journal on decision processes 8 (2020) 3/4, pp. 177-204
Persistent link: https://www.econbiz.de/10012421342
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Fitting an uncertain productivity learning process using an artificial neural network approach
Chen, Toly - In: Computational and mathematical organization theory 24 (2018) 3, pp. 422-439
Persistent link: https://www.econbiz.de/10011885564
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Asymmetric cycle time bounding in semiconductor manufacturing : an efficient and effective back-propagation-network-based method
Chen, Toly - In: Operational research : an international journal 16 (2016) 3, pp. 445-468
Persistent link: https://www.econbiz.de/10011724636
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Developing a software agent for establishing a convenient customer-driven group-buying mechanism
Chen, Toly; Wang, Yi-Chi; Tsai, Horng-Ren; Lin, Yu-Cheng - In: Ubiquitous commerce for creating the personalized …, (pp. 105-116). 2009
Persistent link: https://www.econbiz.de/10003851967
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An evolving hybrid neural approach for predicting job completion time in a semiconductor fabrication plant
Chen, Toly; Wang, Yi-Chi - In: European journal of industrial engineering : EJIE 4 (2010) 3, pp. 336-354
Persistent link: https://www.econbiz.de/10003989013
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A hybrid neural network and selective allowance approach for internal due date assingnment in a wafer fabrication plant
Chen, Toly; Jeang, Angus; Wang, Yi-Chi - In: The international journal of advanced manufacturing … 36 (2008) 5/6, pp. 570-581
Persistent link: https://www.econbiz.de/10003689017
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A fuzzy deep predictive analytics approach for enhancing cycle time range estimation precision in wafer fabrication
Wang, Yu-Cheng; Chen, Toly; Hsu, Ting Chuan - In: Decision analytics journal 1 (2021)
The cycle time of a wafer lot refers to the time that the wafer lot has experienced from its input to output. Predicting the cycle time of each wafer lot is a crucial task for a wafer fabrication factory (wafer fab), but existing prediction methods cannot achieve 100% accuracy. Therefore, if the...
Persistent link: https://www.econbiz.de/10013163062
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Contemporary theory and pragmatic approaches in fuzzy computing utilization
Chen, Toly (contributor) - 2013
"This book presents the most innovative systematic and practical facets of fuzzy computing technologies to students, scholars, and academicians, as well as practitioners, engineers, and professionals"--Provided by publisher.
Persistent link: https://www.econbiz.de/10011727459