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Estimating and incorporating the effects of a future QE project into a semiconductor yield learning model with a fuzzy set approach

Chen, Toly - In: European journal of industrial engineering : EJIE 3 (2009) 2, pp. 207-226

Persistent link: https://www.econbiz.de/10003838369

A hybrid look-ahead SOM-FBPN and FIR system for wafer-lot-output time prediction and achievability evaluation

Chen, Toly - In: The international journal of advanced manufacturing … 35 (2007/08) 5/6, pp. 575-586

Persistent link: https://www.econbiz.de/10003681065

A diversified AHP-tree approach for multiple-criteria supplier selection

Chen, Toly - In: Computational management science 18 (2021) 4, pp. 431-453

Persistent link: https://www.econbiz.de/10012651311

Enhancing the efficiency and accuracy of existing FAHP decision-making methods

Chen, Toly - In: EURO Journal on decision processes 8 (2020) 3/4, pp. 177-204

Persistent link: https://www.econbiz.de/10012421342

Asymmetric cycle time bounding in semiconductor manufacturing : an efficient and effective back-propagation-network-based method

Chen, Toly - In: Operational research : an international journal 16 (2016) 3, pp. 445-468

Persistent link: https://www.econbiz.de/10011724636

Fitting an uncertain productivity learning process using an artificial neural network approach

Chen, Toly - In: Computational and mathematical organization theory 24 (2018) 3, pp. 422-439

Persistent link: https://www.econbiz.de/10011885564

Developing a software agent for establishing a convenient customer-driven group-buying mechanism

Chen, Toly; Wang, Yi-Chi; Tsai, Horng-Ren; Lin, Yu-Cheng - In: Ubiquitous commerce for creating the personalized …, (pp. 105-116). 2009

Persistent link: https://www.econbiz.de/10003851967

An evolving hybrid neural approach for predicting job completion time in a semiconductor fabrication plant

Chen, Toly; Wang, Yi-Chi - In: European journal of industrial engineering : EJIE 4 (2010) 3, pp. 336-354

Persistent link: https://www.econbiz.de/10003989013

A hybrid neural network and selective allowance approach for internal due date assingnment in a wafer fabrication plant

Chen, Toly; Jeang, Angus; Wang, Yi-Chi - In: The international journal of advanced manufacturing … 36 (2008) 5/6, pp. 570-581

Persistent link: https://www.econbiz.de/10003689017

A fuzzy deep predictive analytics approach for enhancing cycle time range estimation precision in wafer fabrication

Wang, Yu-Cheng; Chen, Toly; Hsu, Ting Chuan - In: Decision analytics journal 1 (2021)

The cycle time of a wafer lot refers to the time that the wafer lot has experienced from its input to output. Predicting the cycle time of each wafer lot is a crucial task for a wafer fabrication factory (wafer fab), but existing prediction methods cannot achieve 100% accuracy. Therefore, if the...

Persistent link: https://www.econbiz.de/10013163062