Toggle navigation
Logout
Change account settings
EN
DE
ES
FR
A-Z
Beta
About EconBiz
News
Thesaurus (STW)
Research Skills
Help
EN
DE
ES
FR
My account
Logout
Change account settings
Login
Publications
Events
Your search terms
Search
Retain my current filters
~source:"olc"
Search options
All Fields
Title
Exact title
Subject
Author
Institution
ISBN/ISSN
Published in...
Publisher
Open Access only
Advanced
Search history
My EconBiz
Favorites
Loans
Reservations
Fines
You are here:
Home
Some aspects of WFS data quali...
Similar by person
Narrow search
Delete all filters
| 1 applied filter
Year of publication
From:
To:
Type of publication
All
Article
3
Language
All
Undetermined
2
English
1
Author
All
Verma, V.
2
Betti, Gianni
1
Gagliardi, Francesca
1
Johnson, B.
1
Kumar, M.Jagadesh
1
Lemmi, Achille
1
Verma, Vijay
1
more ...
less ...
Published in...
All
IEEE transactions on reliability : R ; IEEE T R
2
Cambridge journal of regions economy and society
1
Source
All
OLC EcoSci
ECONIS (ZBW)
30
RePEc
5
USB Cologne (EcoSocSci)
4
EconStor
1
Showing
1
-
3
of
3
Sort
relevance
articles prioritized
date (newest first)
date (oldest first)
1
Elimination of Bipolar Induced Drain Breakdown and Single Transistor Latch in Submicron PD SOI MOSFET
Kumar, M.Jagadesh
;
Verma, V.
- In:
IEEE transactions on reliability : R ; IEEE T R
51
(
2002
)
3
,
pp. 367-370
Persistent link: https://www.econbiz.de/10006615952
Saved in:
2
Reliability assessment of fielded plastic and hermetically packaged microelectronics
Johnson, B.
;
Verma, V.
- In:
IEEE transactions on reliability : R ; IEEE T R
45
(
1996
)
1
,
pp. 23-26
Persistent link: https://www.econbiz.de/10006631931
Saved in:
3
Subnational indicators of poverty and deprivation in Europe : methodology and applications
Betti, Gianni
;
Gagliardi, Francesca
;
Lemmi, Achille
; …
- In:
Cambridge journal of regions economy and society
5
(
2012
)
1
,
pp. 129-147
Persistent link: https://www.econbiz.de/10010006750
Saved in:
Results per page
10
25
50
100
250
A service of the
zbw
×
Loading...
