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COMMENTS AND CORRECTIONS - Correction to "A Comparison of Two Simple Prediction Intervals for Exponentail Distribution"
Balakrishnan, N.; Lin, C.-T.; Chan, P.-S. - In: IEEE transactions on reliability : R ; IEEE T R 54 (2005) 2, pp. 366
Persistent link: https://www.econbiz.de/10006606820
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Lifetime Data Analysis - A Comparison of Two Simple Prediction Intervals for Exponential Distribution
Balakrishnan, N.; Lin, C.-T.; Chan, P.-S. - In: IEEE transactions on reliability : R ; IEEE T R 54 (2005) 1, pp. 27-33
Persistent link: https://www.econbiz.de/10006607719
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Estimation - Optimal Step-Stress Test Under Progressive Type-I Censoring
Gouno, E.; Sen, A.; Balakrishnan, N. - In: IEEE transactions on reliability : R ; IEEE T R 53 (2004) 3, pp. 388-393
Persistent link: https://www.econbiz.de/10006609044
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Estimation - Goodness-of-Fit Tests Based on Spacings for Progressively Type-II Censored Data From a General Location-Scale Distribution
Balakrishnan, N.; Ng, H.K.T.; Kannan, N. - In: IEEE transactions on reliability : R ; IEEE T R 53 (2004) 3, pp. 349-356
Persistent link: https://www.econbiz.de/10006609048
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Relationships for moments of order statistics from the right-truncated generalized half logistic distribution
Balakrishnan, N.; Aggarwala, Rita - In: Annals of the Institute of Statistical Mathematics : AISM 48 (1996) 3, pp. 519-534
Persistent link: https://www.econbiz.de/10007321412
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Sooner and later waiting time problems for success and failure runs in higher order Markov dependent trials
Aki, S.; Balakrishnan, N.; Mohanty, S.G. - In: Annals of the Institute of Statistical Mathematics : AISM 48 (1996) 4, pp. 773-788
Persistent link: https://www.econbiz.de/10007374035
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Recurrence relations for single and product moments of progressive Type-II right censored order statistics from exponential and truncated exponential distributions
Aggarwala, Rita; Balakrishnan, N. - In: Annals of the Institute of Statistical Mathematics : AISM 48 (1996) 4, pp. 757-772
Persistent link: https://www.econbiz.de/10007374036
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COMMENTS AND CORRECTIONS - Corrections on "Optimal Step-Stress Test Under Progressive Type-I Censoring"
Han, D.; Balakrishnan, N.; Sen, A.; Gouno, E. - In: IEEE transactions on reliability : R ; IEEE T R 55 (2006) 4, pp. 613
Persistent link: https://www.econbiz.de/10007388283
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Confidence Intervals for Quantiles and Tolerance Intervals Based on Ordered Ranked Set Samples
Balakrishnan, N.; Li, T. - In: Annals of the Institute of Statistical Mathematics : AISM 58 (2006) 4, pp. 757-778
Persistent link: https://www.econbiz.de/10007390477
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Point and Interval Estimation for a Simple Step-Stress Model with Type-II Censoring
Balakrishnan, N.; Kundu, Debasis; Tony Ng, Hon Keung; … - In: Journal of quality technology : a quarterly journal of … 39 (2007) 1, pp. 35-47
Persistent link: https://www.econbiz.de/10007396918