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Balakrishnan, N.
56
Kateri, M.
4
Balasubramanian, K.
3
Chakravarty, A.K.
3
Chandrasekar, B.
3
Lin, C.-T.
3
Ng, H.K.T.
3
Yang, Po
3
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2
Aki, S.
2
Chan, P.-S.
2
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2
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2
Gouno, E.
2
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2
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2
Kannan, N.
2
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2
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2
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2
Sen, A.
2
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1
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1
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1
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1
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1
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1
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1
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1
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1
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1
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1
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1
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1
Han, D.
1
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1
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1
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Annals of the Institute of Statistical Mathematics : AISM
22
IEEE transactions on reliability : R ; IEEE T R
11
Naval research logistics : an international journal
6
Journal of quality technology : a quarterly journal of methods, applications and related topics
4
European journal of operational research : EJOR
2
Journal of the Operational Research Society : OR
2
Sankhya / B : the Indian journal of statistics
2
Allgemeines statistisches Archiv : AStA ; journal of the German Statistical Society
1
American journal of mathematical and management sciences
1
Astin bulletin : the journal of the International Actuarial Association
1
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers
1
Metrika : international journal for theoretical and applied statistics
1
Statistica Neerlandica : journal of the Netherlands Society for Statistics and Operations Research
1
The statistician : journal of the Institute of Statisticians
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OLC EcoSci
RePEc
183
ECONIS (ZBW)
70
Other ZBW resources
3
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1
COMMENTS AND CORRECTIONS - Correction to "A Comparison of Two Simple Prediction Intervals for Exponentail Distribution"
Balakrishnan, N.
;
Lin, C.-T.
;
Chan, P.-S.
- In:
IEEE transactions on reliability : R ; IEEE T R
54
(
2005
)
2
,
pp. 366
Persistent link: https://www.econbiz.de/10006606820
Saved in:
2
Lifetime Data Analysis - A Comparison of Two Simple Prediction Intervals for Exponential Distribution
Balakrishnan, N.
;
Lin, C.-T.
;
Chan, P.-S.
- In:
IEEE transactions on reliability : R ; IEEE T R
54
(
2005
)
1
,
pp. 27-33
Persistent link: https://www.econbiz.de/10006607719
Saved in:
3
Estimation - Optimal Step-Stress Test Under Progressive Type-I Censoring
Gouno, E.
;
Sen, A.
;
Balakrishnan, N.
- In:
IEEE transactions on reliability : R ; IEEE T R
53
(
2004
)
3
,
pp. 388-393
Persistent link: https://www.econbiz.de/10006609044
Saved in:
4
Estimation - Goodness-of-Fit Tests Based on Spacings for Progressively Type-II Censored Data From a General Location-Scale Distribution
Balakrishnan, N.
;
Ng, H.K.T.
;
Kannan, N.
- In:
IEEE transactions on reliability : R ; IEEE T R
53
(
2004
)
3
,
pp. 349-356
Persistent link: https://www.econbiz.de/10006609048
Saved in:
5
Relationships for moments of order statistics from the right-truncated generalized half logistic distribution
Balakrishnan, N.
;
Aggarwala, Rita
- In:
Annals of the Institute of Statistical Mathematics : AISM
48
(
1996
)
3
,
pp. 519-534
Persistent link: https://www.econbiz.de/10007321412
Saved in:
6
Sooner and later waiting time problems for success and failure runs in higher order Markov dependent trials
Aki, S.
;
Balakrishnan, N.
;
Mohanty, S.G.
- In:
Annals of the Institute of Statistical Mathematics : AISM
48
(
1996
)
4
,
pp. 773-788
Persistent link: https://www.econbiz.de/10007374035
Saved in:
7
Recurrence relations for single and product moments of progressive Type-II right censored order statistics from exponential and truncated exponential distributions
Aggarwala, Rita
;
Balakrishnan, N.
- In:
Annals of the Institute of Statistical Mathematics : AISM
48
(
1996
)
4
,
pp. 757-772
Persistent link: https://www.econbiz.de/10007374036
Saved in:
8
COMMENTS AND CORRECTIONS - Corrections on "Optimal Step-Stress Test Under Progressive Type-I Censoring"
Han, D.
;
Balakrishnan, N.
;
Sen, A.
;
Gouno, E.
- In:
IEEE transactions on reliability : R ; IEEE T R
55
(
2006
)
4
,
pp. 613
Persistent link: https://www.econbiz.de/10007388283
Saved in:
9
Confidence Intervals for Quantiles and Tolerance Intervals Based on Ordered Ranked Set Samples
Balakrishnan, N.
;
Li, T.
- In:
Annals of the Institute of Statistical Mathematics : AISM
58
(
2006
)
4
,
pp. 757-778
Persistent link: https://www.econbiz.de/10007390477
Saved in:
10
Point and Interval Estimation for a Simple Step-Stress Model with Type-II Censoring
Balakrishnan, N.
;
Kundu, Debasis
;
Tony Ng, Hon Keung
; …
- In:
Journal of quality technology : a quarterly journal of …
39
(
2007
)
1
,
pp. 35-47
Persistent link: https://www.econbiz.de/10007396918
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