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SPECIAL SECTION ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS - Selectively Breaking Data Dependences to Improve the Utilization of Idle Cycles in Algorithm Level Re-Computing Data...
Wu, K.; Karri, R. - In: IEEE transactions on reliability : R ; IEEE T R 52 (2003) 4, pp. 501-511
Persistent link: https://www.econbiz.de/10006611405
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Transformations and Microstructures - Three-dimensional Observation of Ferrite Plate in Low Carbon Steel Weld
Enomoto, M.; Inagawa, Y.; Wu, K.; Nanba, S.; Murakami, T. - In: Tetsu-to-hagane 91 (2005) 7, pp. 609-615
Persistent link: https://www.econbiz.de/10006691840
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72. DVW-Seminar "Terrestrisches Laser Scanning (TLS 2006)" in Fulda 2006
Bachmann, S.; Dutell, J.; Gasparian, E.; Wu, K.; Kirsch, L. - In: Allgemeine Vermessungs-Nachrichten : AVN ; Zeitschrift … 114 (2007) 2, pp. 67-70
Persistent link: https://www.econbiz.de/10007718679
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Trade and intellectual property rights as channels for economic growth
Wu, Kai; Cai, Hong; Jiang, Renai; Jefferson, Gary H. - In: Asia-Pacific journal of accounting & economics : APJAE 20 (2013) 1, pp. 20-36
Persistent link: https://www.econbiz.de/10010117933