The process capability index Cpk has been widely used in manufacturing industry to provide numerical measures of process potential and performance. As noted by many quality control researchers and practitioners, Cpk is yield-based and is independent of the target T. This fails to account for...

Johnson (1992) developed the process loss index Le, which is defined as the ratio of the expected quadratic loss to the square of half specification width. Tsui (1997) expressed the index LeasLe=Lpe+Lot, which provides an uncontaminated separation between information concerning the potential...

Process capability indices have been proposed in the manufacturing industry to provide numerical measures on process reproduction capability, which are effective tools for quality assurance and guidance for process improvement. In process capability analysis, the usual practice for testing...

Process capability indices have been widely used in the manufacturing industry providing numerical measures on process performance. The index Cp provides measures on process precision (or product consistency). The index Cpm, sometimes called the Taguchi index, meditates on process centring...

Process capability indices have been widely used in the manufacturing industry for measuring process reproduction capability according to manufacturing specifications. Properties of the univariate processes have been investigated extensively, but are comparatively neglected for multivariate...

The Maximum Benefit Chinese Postman Problem (MBCPP) is a practical generalization of the classical Chinese Postman Problem (CPP), which has many real-world applications. In this paper, we consider the MBCPP on undirected networks, and show that the MBCPP is more complex than the Rural Postman...

The process capability index C<Subscript>pk</Subscript> has been widely used in the manufacturing industry to provide numerical measures on process performance. Since C<Subscript>pk</Subscript> is a yield-based index which is independent of the target T, it fails to account for process centering with symmetric tolerances, and presents an...</subscript></subscript>