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An audit of technological innovation capabilities in chinese firms: some empirical findings in Beijing, China
Yam, Richard C. M.
;
Guan, Jian Cheng
;
Pun, Kit Fai
; …
- In:
Research Policy
33
(
2004
)
8
,
pp. 1123-1140
Persistent link: https://www.econbiz.de/10005462111
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