Naikan, V.N.A.; Rathore, Arvind - In: International Journal of Quality & Reliability Management 33 (2016) 1, pp. 120-139
capacitor, its degradation over time, failure data collection, analysis and then modelling the failure times. Principles of DOE … illustrated how failure data can generated by degradation analysis using life test data collection at discrete intervals … resources. Though the degradation study itself is not new but using degradation study for ALT data generation is new. This …