Takeuchi, H.; Yamamoto, Y.; Kamo, Y.; Oku, T.; Nakayama, M. - In: The European Physical Journal B - Condensed Matter and … 52 (2006) 3, pp. 311-314
We have investigated electric field strengths in the Al<Subscript>x</Subscript>Ga<Subscript>1-x</Subscript>N layer, F<Subscript>AlGaN</Subscript>'s, of Al<Subscript>x</Subscript>Ga<Subscript>1-x</Subscript>N/GaN heterostructures with and without a GaN cap layer using photoreflectance (PR) spectroscopy. Franz-Keldysh oscillations (FKOs) from the Al<Subscript>x</Subscript>Ga<Subscript>1-x</Subscript>N layer are clearly observed in the PR spectra. It is...</subscript></subscript></subscript></subscript></subscript></subscript></subscript>
