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Lifetime estimation of tantalum capacitor for mobile applications using empirical and experimental techniques : a DOE approach
Bhargava, Cherry
;
Sharma, Pardeep Kumar
;
Kotecha, Ketan
- In:
International journal of quality & reliability management
39
(
2022
)
7
,
pp. 1592-1600
Persistent link: https://www.econbiz.de/10013397854
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