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On the nearness of record values to order statistics from Pitman’s measure of closeness

Ahmadi, Jafar; Balakrishnan, N. - In: Metrika 76 (2013) 4, pp. 521-541

In the two-sample prediction problem, record values from the present sample may be used as predictors of order statistics from a future sample. In this paper, we investigate the nearness of record statistics (upper and lower) to order statistics from a location-scale family of distributions in...

Persistent link: https://www.econbiz.de/10010896508

Reconstruction of past records

Balakrishnan, N.; Doostparast, M.; Ahmadi, J. - In: Metrika 70 (2009) 1, pp. 89-109

Persistent link: https://www.econbiz.de/10004999451

Exact inference for a simple step-stress model from the exponential distribution under time constraint

Balakrishnan, N.; Xie, Qihao; Kundu, D. - In: Annals of the Institute of Statistical Mathematics 61 (2009) 1, pp. 251-274

Persistent link: https://www.econbiz.de/10005169240

Stochastic monotonicity of the MLE of exponential mean under different censoring schemes

Balakrishnan, N.; Iliopoulos, G. - In: Annals of the Institute of Statistical Mathematics 61 (2009) 3, pp. 753-772

Persistent link: https://www.econbiz.de/10005029243

Progressive censoring from heterogeneous distributions with applications to robustness

Balakrishnan, N.; Cramer, Erhard - In: Annals of the Institute of Statistical Mathematics 60 (2008) 1, pp. 151-171

Persistent link: https://www.econbiz.de/10005616475

Pitman closeness results for Type-I censored data from exponential distribution

Balakrishnan, N.; Davies, Katherine F. - In: Statistics & Probability Letters 83 (2013) 12, pp. 2693-2698

Recent work on Pitman closeness has compared estimators under Type-II censored samples from exponential distribution based on observed number of failures. In this paper, we carry out similar Pitman closeness comparisons for Type-I censored samples from exponential distribution based on time...

Persistent link: https://www.econbiz.de/10010709071

Exact inference for progressively Type-I censored exponential failure data

Balakrishnan, N.; Han, Donghoon; Iliopoulos, G. - In: Metrika 73 (2011) 3, pp. 335-358

Persistent link: https://www.econbiz.de/10008925331

EM algorithm for one-shot device testing under the exponential distribution

Balakrishnan, N.; Ling, M.H. - In: Computational Statistics & Data Analysis 56 (2012) 3, pp. 502-509

The EM algorithm is a powerful technique for determining the maximum likelihood estimates (MLEs) in the presence of binary data since the maximum likelihood estimators of the parameters cannot be expressed in a closed-form. In this paper, we consider one-shot devices that can be used only once...

Persistent link: https://www.econbiz.de/10011056553

Stochastic monotonicity of the MLEs of parameters in exponential simple step-stress models under Type-I and Type-II censoring

Balakrishnan, N.; Iliopoulos, G. - In: Metrika 72 (2010) 1, pp. 89-109

Persistent link: https://www.econbiz.de/10008486686