Similar Search Results

Estimating and incorporating the effects of a future QE project into a semiconductor yield learning model with a fuzzy set approach

Chen, Toly - In: European journal of industrial engineering : EJIE 3 (2009) 2, pp. 207-226

Persistent link: https://www.econbiz.de/10003838369

Asymmetric cycle time bounding in semiconductor manufacturing : an efficient and effective back-propagation-network-based method

Chen, Toly - In: Operational research : an international journal 16 (2016) 3, pp. 445-468

Persistent link: https://www.econbiz.de/10011724636

An evolving hybrid neural approach for predicting job completion time in a semiconductor fabrication plant

Chen, Toly; Wang, Yi-Chi - In: European journal of industrial engineering : EJIE 4 (2010) 3, pp. 336-354

Persistent link: https://www.econbiz.de/10003989013

A hybrid neural network and selective allowance approach for internal due date assingnment in a wafer fabrication plant

Chen, Toly; Jeang, Angus; Wang, Yi-Chi - In: The international journal of advanced manufacturing … 36 (2008) 5/6, pp. 570-581

Persistent link: https://www.econbiz.de/10003689017

A selectively calibrated derivation technique and generalized fuzzy TOPSIS for semiconductor supply chain localization assessment

Chen, Toly; Wang, Yu-Cheng; Jiang, Pin-Hsien - In: Decision analytics journal 8 (2023), pp. 1-12

There is a localization wave in the semiconductor industry for pushing wafer foundries to transfer their production capacity to where chip designers are located. The main reasons for the localization of semiconductor supply chains include the US-China trade war, geopolitics, COVID-19, the...

Persistent link: https://www.econbiz.de/10014516602

A multi-granularity approach for estimating the sustainability of a factory simulation model : semiconductor packaging as an example

Chen, Toly; Wang, Li-chih; Chiu, Min-Chi - In: Operational research : an international journal 18 (2018) 3, pp. 711-729

Persistent link: https://www.econbiz.de/10011917412