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Industry-level analysis of information technology return and risk : what explains the variation?
Ren, Fei; Dewan, Sanjeev - In: Journal of management information systems : JMIS 32 (2015) 2, pp. 71-103
Persistent link: https://www.econbiz.de/10011409374
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Liquidity, maturity, and the yields on US Treasury securities
Amihud, Yakov - In: The journal of finance : the journal of the American … 46 (1991) 4, pp. 1411-1425
Persistent link: https://www.econbiz.de/10001112566
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Volatility, efficiency, and trading : evidence from the Japanese stock market
Amihud, Yakov - In: The journal of finance : the journal of the American … 46 (1991) 5, pp. 1765-1789
Persistent link: https://www.econbiz.de/10001115517
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Stock market microstructure and return volatility : evidence from Italy
Amihud, Yakov - In: Journal of banking & finance 14 (1990) 2, pp. 423-440
Persistent link: https://www.econbiz.de/10001092356