Dotto, M.E.R; Kleinke, M.U - In: Physica A: Statistical Mechanics and its Applications 295 (2001) 1, pp. 149-153
In this work, surface morphology of Si etched surfaces generated with distinct physical constrains for attack, has been investigated by atomic force microscope (AFM). Statistical properties measured from AFM images prove that these surfaces present self-affine behavior; and also suggest that Si...