Narrow search
Showing 1 - 3 of 3
Cover Image
A Bayesian approach for measuring process performance with asymmetric tolerances
Wu, Chien-wei - In: European journal of industrial engineering : EJIE 6 (2012) 3, pp. 347-368
Persistent link: https://www.econbiz.de/10009561410
Cover Image
An improved approach for process performance evaluation with the consideration of process yield and quality loss
Wu, Chien-wei; Lin, Chi-wei; Chen, James C. - In: International journal of production research 51 (2013) 21, pp. 6397-6409
Persistent link: https://www.econbiz.de/10010228988
Cover Image
An improved approach for constructing lower confidence bound on process yield
Wu, Chien-wei; Liao, Mou-Yuan; Chen, James C. - In: European journal of industrial engineering : EJIE 6 (2012) 3, pp. 369-390
Persistent link: https://www.econbiz.de/10009561408