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~subject:"Repeated measurements design"
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Repeated measurements design
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Kunert, Joachim
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Martin, R. J.
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Institut für Wirtschafts- und Sozialstatistik, Universität Dortmund
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Technical report / Sonderforschungsbereich 475 Komplexitätsreduktion in Multivariaten Datenstrukturen, Universität Dortmund
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Optimality of type I orthogonal arrays for cross-over models with correlated errors
Kunert, Joachim
;
Martin, R. J.
-
Institut für Wirtschafts- und Sozialstatistik, …
-
1998
We show that binary designs for cross-over models obtained from orthogonal arrays are universally optimal under correlated errors.
Persistent link: https://www.econbiz.de/10010955494
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2
Optimality of type I orthogonal arrays for cross-over models with correlated errors
Kunert, Joachim
;
Martin, R. J.
-
1998
We show that binary designs for cross-over models obtained from orthogonal arrays are universally optimal under correlated errors.
Persistent link: https://www.econbiz.de/10010316461
Saved in:
3
Optimality of type I orthogonal arrays for cross-over models with correlated errors
Kunert, Joachim
;
Martin, R. J.
-
1998
Persistent link: https://www.econbiz.de/10010467699
Saved in:
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