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TOPOGRAPHICAL EVOLUTION OF MAGNETRON SPUTTERING Ti THIN FILMS DURING OXIDATION OBSERVED BY AFM

LI, XINYUE; JIN, YONGZHONG; LIU, DONGLIANG; ZENG, XIANGUANG - In: Surface Review and Letters (SRL) 18 (2011) 01, pp. 61-69

Titanium films of 120 nm thickness were magnetron sputtered on glass substrates at room temperature, and subsequently they were annealed under flowing oxygen atmosphere at different temperatures and time. Atomic force microscopy (AFM) was used to study topographic characteristics of the films,...

Persistent link: https://www.econbiz.de/10010883154

MONOLAYER CHARACTERISTICS OF CHITOSAN ASSEMBLED IN LANGMUIR FILMS MIXED WITH ARACHIDIC ACID

NATH, JAYASREE; NATH, RANENDU KUMAR; CHAKRABORTY, ADRITA; … - In: Surface Review and Letters (SRL) 21 (2014) 04, pp. 1450049-1

In this paper, we report our investigation on the monolayer characteristics of a nontoxic, biocompatible, and biodegradable polymer chitosan (CHS) using Langmuir–Blodgett technique. It has been observed that pure CHS do not form stable monolayer. However, when CHS is mixed with arachidic acid...

Persistent link: https://www.econbiz.de/10010885173

EVOLUTION OF THE COPPER SURFACE IN THE COURSE OF OXIDATION BY CCl4–L (L=THF, DMF, DMSO): SCANNING PROBE MICROSCOPE STUDY

PANTELEEV, S. V.; MASLENNIKOV, S. V.; IGNATOV, S. K.; … - In: Surface Review and Letters (SRL) 20 (2013) 03, pp. 1350023-1

The evolution of compact surface of the 100 nm copper film deposited on the glass-ceramics doped with vanadium coating … roughness of copper films. The amount of the metal reacted has an almost linear dependence on the reaction time. AFM scans … indicate that there is the same mechanism of the reaction between copper and carbon tetrachloride for all solvents. …

Persistent link: https://www.econbiz.de/10011011161

MECHANICAL AND TRIBOLOGICAL BEHAVIOR OF VN AND HfN FILMS DEPOSITED VIA REACTIVE MAGNETRON SPUTTERING

ESCOBAR, C.; VILLARREAL, M.; CAICEDO, J. C.; ESTEVE, J.; … - In: Surface Review and Letters (SRL) 20 (2013) 03, pp. 1350040-1

HfN and VN thin films were deposited onto silicon and 4140 steel substrates with r.f. reactive magnetron sputtering by using Hf and V metallic targets with 4-inch diameter and 99.9% purity in argon/nitrogen atmosphere, applying a substrate temperature of 250°C and a pressure of 1.2 × 10-3...

Persistent link: https://www.econbiz.de/10011011165

PREPARATION AND FERROELECTRIC PROPERTIES OF LEAD-FREE A0.5Bi0.5TiO3 (A = Na OR K) THIN FILMS

DING, Y. L.; ZHANG, X. H.; YANG, C. H.; ZHANG, X. Y.; … - In: Surface Review and Letters (SRL) 18 (2011) 03, pp. 121-125

Both ferroelectric Na0.5Bi0.5TiO3 (NBT) and K0.5Bi0.5TiO3 (KBT) are considered as the best known lead-free materials. In this experiment, we prepared NBT and KBT thin films on Pt/TiO2/SiO2/Si substrates by metalorganic solution deposition. The structural properties and surface morphologies were...

Persistent link: https://www.econbiz.de/10011011167

SURFACE CHARACTERIZATION AND GRAIN SIZE CALCULATION OF SILVER FILMS DEPOSITED BY THERMAL EVAPORATION

MAQBOOL, MUHAMMAD; KHAN, TAHIRZEB - In: Surface Review and Letters (SRL) 12 (2005) 05, pp. 759-766

Thin films of pure silver were deposited on glass substrate by thermal evaporation process at room temperature. Surface characterization of the films was performed using X-ray diffraction (XRD) and Atomic Force Microscopy (AFM). Thickness of the films varied between 20 nm and 60 nm. XRD analysis...

Persistent link: https://www.econbiz.de/10005080490

OPTICAL WAVEGUIDE FABRICATION AND REFRACTIVE INDEX CHARACTERIZATION OF Nd:LuVO4 THIN FILMS BY PULSED LASER DEPOSITION

LI, HONGXIA; WU, XIN; SONG, RENGUO; WANG, JIYANG - In: Surface Review and Letters (SRL) 14 (2007) 06, pp. 1079-1082

High-quality Nd:LuVO4 thin films have been grown on silica glass substrates by using a pulsed laser deposition technique. X-ray diffraction results show that the as-deposited Nd:LuVO4 film is basically oriented polycrystalline, and strong (200) peak was revealed. The waveguide property was...

Persistent link: https://www.econbiz.de/10005080578

MODEL OF THE POTENTIAL BARRIER OUTSIDE THE SURFACE OF A CONDUCTOR WITH WALLS OF FINITE THICKNESS

LI, L. X.; LIU, R. P.; ZHANG, D. T.; LI, B. H.; CUI, Y. L. - In: Surface Review and Letters (SRL) 14 (2007) 05, pp. 963-967

Tunneling effect of graphite is studied by atomic force microscopy. The tunneling current in the gap between a conductive tip and a newly cleaved graphite surface at a given voltage keeps almost constant when the gap-distance varies within 1 μm, which cannot be explained by the commonly...

Persistent link: https://www.econbiz.de/10005080584

EFFECTS OF SPUTTERED Ar PRESSURE AND SUBSTRATE TEMPERATURE ON THE MICROSTRUCTURE AND MAGNETIC PROPERTIES OF Cr/SmCo5/Cr FILMS

ZHEN, CONGMIAN; ZHANG, JINJUAN; MA, LI; HOU, DENGLU; … - In: Surface Review and Letters (SRL) 15 (2008) 01, pp. 105-109

Cr/SmCo5/Cr films were fabricated by a DC facing targets magnetron sputtering. The influences of sputtered Ar pressure and substrate temperature on their microstructure and magnetic properties were investigated. Magnetic measurements indicate that the optimal substrate temperature was 450°C,...

Persistent link: https://www.econbiz.de/10005080641

DISLOCATION GROWTH AND MICROCRYSTAL FORMATION OF MANGANESE MERCURY THIOCYANATE CRYSTALS

GENG, Y. L.; XU, D.; WANG, X. Q.; YU, G. W.; ZHANG, G. H. - In: Surface Review and Letters (SRL) 12 (2005) 03, pp. 413-416

Dislocation growth and microcrystals are investigated on the {110} faces of MMTC crystals grown from aqueous solution. Growth of MMTC crystals occurs in elementary steps (~ 0.81 nm), introduced by both simple and complex dislocation sources. The bright particles with regular sizes and shapes are...

Persistent link: https://www.econbiz.de/10004971826