LI, X. T.; WU, C.; WENG, W. J.; HAN, G. R.; DU, P. Y. - In: Surface Review and Letters (SRL) 15 (2008) 01, pp. 13-18
A series of (Pb0.4Sr0.6)1-xLa2x/3TiO3 (PSLT) thin films were deposited on ITO/glass substrates by sol–gel technique. Their phase status, surface morphology, and dielectric properties were studied by X-ray diffraction, scanning electron microscope, and impedance analyzer, respectively. Results...