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Efficient methods for comparing two process yields : strategies on supplier selection

Wu, Chien-wei; Liao, Mou-yuan; Yang, Tsung-tse - In: International journal of production research 51 (2013) 5, pp. 1587-1602

Persistent link: https://www.econbiz.de/10009705713

An improved approach for process performance evaluation with the consideration of process yield and quality loss

Wu, Chien-wei; Lin, Chi-wei; Chen, James C. - In: International journal of production research 51 (2013) 21, pp. 6397-6409

Persistent link: https://www.econbiz.de/10010228988

Designing a yield-based skip-lot sampling plan for lot acceptance determination

Wu, Chien-wei; Chen, Jr-Tzung; Liu, Shih-Wen - In: Journal of the Operational Research Society 73 (2022) 3, pp. 653-663

Persistent link: https://www.econbiz.de/10013170170

A variable-type skip-lot sampling plan for products with a unilateral specification limit

Wu, Chien-wei; Lee, Amy H. I.; Huang, Yi-San - In: International journal of production research 59 (2021) 14, pp. 4140-4156

Persistent link: https://www.econbiz.de/10012589275

A modified sampling plan by variables with an adjustable mechanism for lot sentencing

Wu, Chien-wei; Chen, Jr-Tzung - In: Journal of the Operational Research Society 72 (2021) 3, pp. 678-687

Persistent link: https://www.econbiz.de/10012500980

Developing a variables multiple dependent state sampling plan with simultaneous consideration of process yield and quality loss

Wu, Chien-wei; Wang, Zih-Huei - In: International journal of production research 55 (2017) 7/8, pp. 2351-2364

Persistent link: https://www.econbiz.de/10011648606

An improved approach for constructing lower confidence bound on process yield

Wu, Chien-Wei; Liao, Mou-Yuan; Chen, James C. - In: European Journal of Industrial Engineering 6 (2012) 3, pp. 369-390

Process yield, the percentage of processed product units passing inspection, is a standard numerical measure of process performance in manufacturing industry. Based on the expression of process yield, Boyles (1994) presented a yield-measure index, Spk, for normally distributed processes. In...

Persistent link: https://www.econbiz.de/10010667491