Drèze, Jacques H.; Richard, Jean-François - In: Handbook of econometrics : volume 1, (pp. 517-598). 1983
This chapter discusses the Bayesian inference and identification. A Bayesian analysis of the scanning electron microscope (SEM) proceeds along the same lines as any other Bayesian analysis. Thus, if the analyst has chosen to work in a given parameter space, a prior density on that space is...