Zhang, C. W.; Xie, M.; Goh, T. N. - In: Stochastics and Quality Control 20 (2005) 2, pp. 205-222
Abstract Control charts for high quality processes based on counting cumulative conforming items have attracted a lot of attention recently. However, such charting procedures usually apply when items are inspected one by one. There are situations that products are inspected sample by sample for...
