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Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
Lu, C.-J.; Tsai, D.-M. - In: International journal of production research : American … 42 (2004) 20, pp. 4331-4352
Persistent link: https://www.econbiz.de/10006125029
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A fast machine vision approach for automatic recognition of industrial parts
Tsai, D.-M.; Chen, M.-F. - In: International journal of production research : American … 34 (1996) 3, pp. 687-700
Persistent link: https://www.econbiz.de/10006141339
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A simulated annealing approach for optimization of multi-pass turning operations
Chen, M.-C.; Tsai, D.-M. - In: International journal of production research : American … 34 (1996) 10, pp. 2803-2826
Persistent link: https://www.econbiz.de/10006142519
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One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction
Tsai, D.-M.; Chuang, S.-T.; Tseng, Y.-H. - In: International journal of production research : American … 45 (2007) 6, pp. 1297-1322
Persistent link: https://www.econbiz.de/10007597301
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Simulation optimization through direct search for multi-objective manufacturing systems
Chen, M.-C.; Tsai, D.-M. - In: Production planning & control : PPC 7 (1996) 6, pp. 554-565
Persistent link: https://www.econbiz.de/10007206597
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A Machine Vision Approach for Detecting and Inspecting Circular Parts
Tsai, D.-M. - 1999
Persistent link: https://www.econbiz.de/10006988754